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  1. 50 Years of TEM of dislocations: Past, present and future.P. Hirsch, D. Cockayne, J. Spence & M. Whelan - 2006 - Philosophical Magazine 86 (29-31):4519-4528.
    The first observations of dislocations by TEM were published in 1956. Since then the technique has been developed into an indispensable tool for the materials scientist, not only for the characterization of the extended defect structure of materials, but also for the elucidation of the mechanisms controlling their properties. To mark the 50th anniversary of the original work, this Special Issue consists of reprints of the three original papers and some 22 current state-of-the-art articles, which provide a snapshot of the (...)
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  • Novel TEM methods for large-area analysis of misfit dislocation networks in semiconductor heterostructures.E. Spiecker - 2006 - Philosophical Magazine 86 (29-31):4941-4963.
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