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  1. The contributions from some scattering processes to scanning electron microscope contrast.C. R. Hall - 1970 - Philosophical Magazine 21 (173):1075-1080.
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  • Channelling effects in high-resolution scanning electron microscopy.A. Howie, P. F. Linington & P. N. Tomlinson - 1971 - Philosophical Magazine 23 (186):1559-1565.
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  • Magnetic domain contrast in backscattered electron images obtained with a scanning electron microscope.T. Yamamoto, H. Nishizawa & K. Tsuno - 1976 - Philosophical Magazine 34 (2):311-325.
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  • Direct observation of magnetic domains by scanning electron microscopy.D. C. Joy & J. P. Jakubovics - 1968 - Philosophical Magazine 17 (145):61-69.
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  • Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging.J. Ahmed, S. G. Roberts & A. J. Wilkinson - 2006 - Philosophical Magazine 86 (29-31):4965-4981.
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  • Case studies on the application of high-resolution electron channelling contrast imaging – investigation of defects and defect arrangements in metallic materials.Anja Weidner & Horst Biermann - 2015 - Philosophical Magazine 95 (7):759-793.
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  • Electron channelling patterns from ferromagnetic crystals in the scanning electron microscope.D. C. Joy, E. M. Schulsona, J. P. Jakcbovics & C. G. Vax Essen - 1969 - Philosophical Magazine 20 (166):843-847.
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  • Calculations of lattice defect images for scanning electron microscopy.D. R. Clarke & A. Howie - 1971 - Philosophical Magazine 24 (190):959-971.
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  • A correspondence principle for the channelling of fast charged particles.Lewis T. Chadderton - 1968 - Philosophical Magazine 18 (155):1017-1031.
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