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  1. An experimental determination of the electrical resistivity of dislocations in copper.J. G. Rider & C. T. B. Foxon - 1967 - Philosophical Magazine 16 (144):1133-1138.
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  • On dislocation loss in thin film electron microscopy of polycrystalline copper.C. T. B. Foxon & J. G. Rider - 1968 - Philosophical Magazine 17 (148):729-734.
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