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  1. Inelastic scattering and energy filtering in the transmission electron microscope.R. F. Egerton - 1976 - Philosophical Magazine 34 (1):49-65.
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  • The distribution of intensity in electron diffraction patterns due to phonon scattering.P. Rez, C. J. Humphreys & M. J. Whelan - 1977 - Philosophical Magazine 35 (1):81-96.
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  • The optimum voltage in very high voltage electron microscopy.C. J. Humphreys - 1972 - Philosophical Magazine 25 (6):1459-1472.
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