Switch to: References

Citations of:

Maximizing the penetration in high voltage electron microscopy

C. J. Humphreys, L. E. Thomas, J. S. Lally & R. M. Fisher

Philosophical Magazine 23 (181):87-114 (1971)

Add citations

You must login to add citations.

The optimum voltage in very high voltage electron microscopy.C. J. Humphreys - 1972 - Philosophical Magazine 25 (6):1459-1472.details Download Export citation Bookmark 1 citation
The critical voltage effect in high voltage electron microscopy.J. S. Lally, C. J. Humphreys, A. J. F. Metherell & R. M. Fisher - 1972 - Philosophical Magazine 25 (2):321-343.details Download Export citation Bookmark 1 citation
A note on the increase in usable foil thickness in scanning transmission electron microscopy.Hamish L. Fraser & Ian P. Jones - 1975 - Philosophical Magazine 31 (1):225-228.details Download Export citation Bookmark 1 citation
On the relationship between projected crystal potential and the form of certain zone axis patterns in high energy electron diffraction.M. D. Shannon & J. W. Steeds - 1977 - Philosophical Magazine 36 (2):279-307.details Download Export citation Bookmark 1 citation
Pénétration des électrons dans les corps de poids atomique élevé sous des tensions accélératrices atteignant 3000 kV cas de l'or et du tantale.C. Roucau & R. Ayroles - 1975 - Philosophical Magazine 31 (2):387-404.details Download Export citation Bookmark
Effet des reflexions multiples sur le contraste des parois antiphases en microscopic electronique.Par A. Renault, J. M. Penisson & A. Bourret - 1973 - Philosophical Magazine 28 (1):103-132.details Download Export citation Bookmark 1 citation
Limiting factors in specimen thickness in conventional and scanning transmission electron microscopy.H. L. Fraser, I. P. Jones & M. H. Loretto - 1977 - Philosophical Magazine 35 (1):159-176.details Download Export citation Bookmark

1