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  1. Origin of the fringe structure observed in high resolution bright-field electron micrographs of amorphous materials.W. Krakow, D. G. Ast, W. Goldfarb & B. M. Siegel - 1976 - Philosophical Magazine 33 (6):985-1014.
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  • Application of electron optical techniques to the study of amorphous materials.A. Howie - 2010 - Philosophical Magazine 90 (35-36):4647-4660.
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  • Structure factor of a random stacking sequence.C. H. Hodges - 1974 - Philosophical Magazine 29 (5):1221-1225.
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  • Interpretation of electron micrographs and diffraction patterns of amorphous materials.A. Howie, O. L. Krivanek & M. L. Rudee - 1973 - Philosophical Magazine 27 (1):235-255.
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  • Construction of a model for amorphous tetrahedral materials using ordered units.P. H. Gaskell - 1975 - Philosophical Magazine 32 (1):211-229.
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