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  1. Studies of dislocations by field ion microscopy and atom probe tomography.G. D. W. Smith, D. Hudson, P. D. Styman & C. A. Williams - 2013 - Philosophical Magazine 93 (28-30):3726-3740.
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  • Forces on dislocations in field-ion specimens; further analysis of some previous observations.D. A. Smith, P. J. Birdseye & M. J. Gorinoe - 1973 - Philosophical Magazine 27 (5):1175-1181.
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  • Distinction of intrinsic from extrinsic stacking faults in field-ion micrographs.D. A. Smith - 1969 - Philosophical Magazine 19 (161):1083-1084.
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  • Inelastic changes in specimens during operation of the field-ion microscope.B. Loberg - 1971 - Philosophical Magazine 24 (189):593-602.
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