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  1. Magnetic domain contrast in backscattered electron images obtained with a scanning electron microscope.T. Yamamoto, H. Nishizawa & K. Tsuno - 1976 - Philosophical Magazine 34 (2):311-325.
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  • Case studies on the application of high-resolution electron channelling contrast imaging – investigation of defects and defect arrangements in metallic materials.Anja Weidner & Horst Biermann - 2015 - Philosophical Magazine 95 (7):759-793.
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  • The dependence of electron damage on crystal orientation in the HVEM.P. A. Doyle - 1974 - Philosophical Magazine 29 (3):537-545.
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  • Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging.J. Ahmed, S. G. Roberts & A. J. Wilkinson - 2006 - Philosophical Magazine 86 (29-31):4965-4981.
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