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  1. The optimum voltage in very high voltage electron microscopy.C. J. Humphreys - 1972 - Philosophical Magazine 25 (6):1459-1472.
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  • Effect of impurities on the growth of {113} interstitial clusters in silicon under electron irradiation.K. Nakai, K. Hamada, Y. Satoh & T. Yoshiie - 2011 - Philosophical Magazine 91 (3):421-436.
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  • Limiting factors in specimen thickness in conventional and scanning transmission electron microscopy.H. L. Fraser, I. P. Jones & M. H. Loretto - 1977 - Philosophical Magazine 35 (1):159-176.
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