Switch to: Citations

References in:

Characterization of stacking faults with the field-ion microscope

Philosophical Magazine 22 (176):317-327 (1970)

Add references

You must login to add references.

Contrast from stacking faults and partial dislocations in the field-ion microscope.D. A. Smith, M. A. Fortes, A. Kelly & B. Ralph - 1968 - Philosophical Magazine 17 (149):1065-1077.details Download Export citation Bookmark 15 citations
The interpretation of field-ion micrographs: Contrast from perfect dislocation loops.M. A. Fortes, D. A. Smith & B. Ralph - 1968 - Philosophical Magazine 17 (145):169-176.details Download Export citation Bookmark 11 citations
Computer simulation of spherical crystal surfaces: Stacking faults and partial dislocation in f.c.c. crystals.A. J. Perry & D. G. Brandon - 1968 - Philosophical Magazine 18 (152):353-359.details Download Export citation Bookmark 3 citations
Distinction of intrinsic from extrinsic stacking faults in field-ion micrographs.D. A. Smith - 1969 - Philosophical Magazine 19 (161):1083-1084.details Download Export citation Bookmark 2 citations
On distinguishing between intrinsic and extrinsic faults in field-ion micrographs.S. Ranganathan - 1969 - Philosophical Magazine 19 (158):415-419.details Download Export citation Bookmark 3 citations
The occurrence of glissile Shockley loops in field-ion specimens of iridium.M. A. Fortes & B. Ralph - 1968 - Philosophical Magazine 18 (154):787-805.details Download Export citation Bookmark 9 citations
Contrast from dislocations in field-ion images.M. A. Fortes & B. Ralph - 1969 - Philosophical Magazine 19 (157):181-187.details Download Export citation Bookmark 2 citations

1