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  1. A relation between dark field electron micrographs of lattice defects.C. J. Ball - 1964 - Philosophical Magazine 9 (100):541-544.
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  • Diffraction contrast analysis of two-dimensional defects present in silicon after annealing.G. R. Booker & W. J. Tunstall - 1966 - Philosophical Magazine 13 (121):71-83.
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  • Electron diffraction from crystals containing stacking faults: I.M. J. Whelan & P. B. Hirsch - 1957 - Philosophical Magazine 2 (21):1121-1142.
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  • Diffraction contrast effects from stacking faults with phase angle π.C. M. Drum & M. J. Whelan - 1965 - Philosophical Magazine 11 (109):205-212.
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  • Direct observation of antiphase boundaries in the AuCu3superlattice.R. M. Fisher & M. J. Marcinkowski - 1961 - Philosophical Magazine 6 (71):1385-1405.
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  • Electron microscope image profiles of planar defects in crystals.G. R. Booker & P. M. Hazzledine - 1967 - Philosophical Magazine 15 (135):523-527.
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