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  1. The effect of grain boundaries on the electrical resistivity of polycrystalline copper and aluminium.P. V. Andrews, M. B. West & C. R. Robeson - 1969 - Philosophical Magazine 19 (161):887-898.
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  • The electrical resistivity of dislocations.Z. S. Basinski, J. S. Dugdale & A. Howie - 1963 - Philosophical Magazine 8 (96):1989-1997.
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  • An experimental determination of electrical resistivity of dislocations in aluminium.J. G. Rider & C. T. B. Foxon - 1966 - Philosophical Magazine 13 (122):289-303.
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  • The determination of dislocation densities in thin films.R. K. Ham - 1961 - Philosophical Magazine 6 (69):1183-1184.
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