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  1. The distribution of intensity in electron diffraction patterns due to phonon scattering.P. Rez, C. J. Humphreys & M. J. Whelan - 1977 - Philosophical Magazine 35 (1):81-96.
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  • The optimum voltage in very high voltage electron microscopy.C. J. Humphreys - 1972 - Philosophical Magazine 25 (6):1459-1472.
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  • A note on the increase in usable foil thickness in scanning transmission electron microscopy.Hamish L. Fraser & Ian P. Jones - 1975 - Philosophical Magazine 31 (1):225-228.
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  • Electron excitation and the optical potential in electron microscopy.R. H. Ritchie & A. Howie - 1977 - Philosophical Magazine 36 (2):463-481.
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  • Stacking fault contrast from plasmon-scattered electrons.Arne Melander - 1975 - Philosophical Magazine 31 (3):599-608.
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  • Inelastic scattering of fast electrons by crystals.C. J. Humphreys & M. J. Whelan - 1969 - Philosophical Magazine 20 (163):165-172.
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  • Inelastic scattering and energy filtering in the transmission electron microscope.R. F. Egerton - 1976 - Philosophical Magazine 34 (1):49-65.
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