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  1. 50 Years of TEM of dislocations: Past, present and future.P. Hirsch, D. Cockayne, J. Spence & M. Whelan - 2006 - Philosophical Magazine 86 (29-31):4519-4528.
    The first observations of dislocations by TEM were published in 1956. Since then the technique has been developed into an indispensable tool for the materials scientist, not only for the characterization of the extended defect structure of materials, but also for the elucidation of the mechanisms controlling their properties. To mark the 50th anniversary of the original work, this Special Issue consists of reprints of the three original papers and some 22 current state-of-the-art articles, which provide a snapshot of the (...)
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  • Imaging dislocation cores – the way forward.J. C. H. Spence⊥, H. R. Kolar, G. Hembree, C. J. Humphreys, J. Barnard, R. Datta, C. Koch, F. M. Ross & J. F. Justo - 2006 - Philosophical Magazine 86 (29-31):4781-4796.
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  • A dissociated dislocation in an ultrathin silicon plate.S. Youssef & R. Bonnet - 2006 - Philosophical Magazine 86 (20):3077-3088.
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  • The study of dipoles in Cu—Al alloys using weak-beam electron microscopy.E. Wintner & H. P. Karnthaler - 1977 - Philosophical Magazine 36 (6):1317-1329.
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  • Estimating the strength of single-ended dislocation sources in micron-sized single crystals.S. I. Rao, D. M. Dimiduk, M. Tang, M. D. Uchic, T. A. Parthasarathy & C. Woodward - 2007 - Philosophical Magazine 87 (30):4777-4794.
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  • The formation and glide of jogs in low stacking-fault energy face-centred cubic materials.C. B. Carter & P. B. Hirsch - 1977 - Philosophical Magazine 35 (6):1509-1522.
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  • Alternate dissociation of the screw dislocations in a buried small-angle twist boundary in silicon.R. Bonnet, M. Loubradou, S. Youssef, J. -L. Rouvière & F. Fournel - 2009 - Philosophical Magazine 89 (5):413-434.
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