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  1. The optimum voltage in very high voltage electron microscopy.C. J. Humphreys - 1972 - Philosophical Magazine 25 (6):1459-1472.
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  • Inelastic scattering of 80 keV electrons in amorphous carbon.R. F. Egerton - 1975 - Philosophical Magazine 31 (1):199-215.
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  • Preservation of electron microscope image contrast after inelastic scattering.S. L. Cundy, A. Howie & U. Valdrè - 1969 - Philosophical Magazine 20 (163):147-163.
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  • The dependence of the mean absorption coefficient for fast electrons on the Bragg deviation parameter.A. J. F. Metherell - 1967 - Philosophical Magazine 16 (144):1103-1109.
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  • Stacking fault contrast from plasmon-scattered electrons.Arne Melander - 1975 - Philosophical Magazine 31 (3):599-608.
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  • Absorption parameters in electron diffraction theory.C. J. Humphreys & P. B. Hirsch - 1968 - Philosophical Magazine 18 (151):115-122.
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  • Inelastic scattering and energy filtering in the transmission electron microscope.R. F. Egerton - 1976 - Philosophical Magazine 34 (1):49-65.
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