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  1. Maximizing the penetration in high voltage electron microscopy.C. J. Humphreys, L. E. Thomas, J. S. Lally & R. M. Fisher - 1971 - Philosophical Magazine 23 (181):87-114.
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  • Investigations of dislocation strain fields using weak beams.D. J. H. Cockayne, I. L. F. Ray & M. J. Whelan - 1969 - Philosophical Magazine 20 (168):1265-1270.
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  • Absorption parameters in electron diffraction theory.C. J. Humphreys & P. B. Hirsch - 1968 - Philosophical Magazine 18 (151):115-122.
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