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  1. Maximizing the penetration in high voltage electron microscopy.C. J. Humphreys, L. E. Thomas, J. S. Lally & R. M. Fisher - 1971 - Philosophical Magazine 23 (181):87-114.
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  • The critical voltage effect in high voltage electron microscopy.J. S. Lally, C. J. Humphreys, A. J. F. Metherell & R. M. Fisher - 1972 - Philosophical Magazine 25 (2):321-343.
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  • The simulation and interpretation of zone axis patterns in molybdenite.G. J. Tatlock - 1975 - Philosophical Magazine 32 (6):1159-1170.
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