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  1. The analysis of field-ion micrographs: Stacking faults in tungsten.D. A. Smith & K. M. Bowkett - 1968 - Philosophical Magazine 18 (156):1219-1233.
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  • Contrast from stacking faults and partial dislocations in the field-ion microscope.D. A. Smith, M. A. Fortes, A. Kelly & B. Ralph - 1968 - Philosophical Magazine 17 (149):1065-1077.
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  • On distinguishing between intrinsic and extrinsic faults in field-ion micrographs.S. Ranganathan - 1969 - Philosophical Magazine 19 (158):415-419.
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